Thermal Analysis of Supported Thin Films within the Nanostructurome Pipeline
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A comparison of the results obtained with thermoanalytical techniques can show con-siderable differences between thin film samples and the corresponding xerogels/pow-ders. One reason for this is that the substrate material itself influences the properties and morphology of the deposited films. It therefore makes sense to carry out meas-urements for thin film samples that have been deposited on a substrate. Thermograv-imetric and differential scanning calorimetry measurements on thin films are possible even if the mass of the thin film on a massive substrate is very small. With the de-scribed approach, it is shown that each chemical system behaves differently depend-ing on the type of precursor and deposition method, but nevertheless the results of the thin film measurements are helpful in optimising the properties of the final films for a specific application.
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