Thermal Analysis of Supported Thin Films within the Nanostructurome Pipeline

Avtorji

Romana Cerc Korošec
University of Ljubljana, Faculty of Chemistry and Chemical Technology, Ljubljana, Slovenia
Urška Lavrenčič Štangar
University of Ljubljana, Faculty of Chemistry and Chemical Technology, Ljubljana, Slovenia

Kratka vsebina

A comparison of the results obtained with thermoanalytical techniques can show con-siderable differences between thin film samples and the corresponding xerogels/pow-ders. One reason for this is that the substrate material itself influences the properties and morphology of the deposited films. It therefore makes sense to carry out meas-urements for thin film samples that have been deposited on a substrate. Thermograv-imetric and differential scanning calorimetry measurements on thin films are possible even if the mass of the thin film on a massive substrate is very small. With the de-scribed approach, it is shown that each chemical system behaves differently depend-ing on the type of precursor and deposition method, but nevertheless the results of the thin film measurements are helpful in optimising the properties of the final films for a specific application.

Prenosi

Izdano

10 June 2025

Kako citirati

Cerc Korošec, R., & Lavrenčič Štangar, U. (2025). Thermal Analysis of Supported Thin Films within the Nanostructurome Pipeline. In V. Kralj-Iglič, Y. Istileulova, & A. Romolo (Eds.), Socratic Lectures 12 th International Symposium, Ljubljana, January 11, 2025: PART III (pp. 89–93). Založba Univerze v Ljubljani. https://doi.org/10.55295/PSL.12.2025.III11